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Measurement of the thermal conductivity of molten semiconductors

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AbstractThe thermal conductivity of molten InSb in the temperature range between 800 and 870 K was measured by the transient hot-wire method using a ceramic probe. The probe was fabricated from a tungsten wire printed on an alumina substrate and coated with a thin alumina layer.



出版机构:Springer US刊物名称:International Journal of Thermophysics
出版时间:1988
ISSN:0195-928X
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